Experimental Evaluation of Transient Effects on SRAM-based FPGA Chips

This paper presents an experimental evaluation of transient effects on SRAM-based FPGAs. A total of 9000 transient faults were injected into the target FPGA using Power Supply Disturbances (PSD). The results show that nearly 60 percent of faults cause system failures and about 58 percent of the faults lead to corruption of the configuration data of the FPGA chip.